A novel key-variable sifting algorithm for virtual metrology.
Tung-Ho LinFan-Tien ChengAeo-Juo YeWei-Ming WuMin-Hsiung HungPublished in: ICRA (2008)
Keyphrases
- improved algorithm
- optimization algorithm
- search space
- cost function
- dynamic programming
- learning algorithm
- times faster
- detection algorithm
- preprocessing
- k means
- experimental evaluation
- computational cost
- high accuracy
- worst case
- linear programming
- computational complexity
- semi supervised
- evolutionary algorithm
- objective function
- classification algorithm
- matching algorithm
- camera calibration
- path planning
- similarity measure
- convergence rate
- recognition algorithm
- selection algorithm
- computer vision