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Efficient Optimized Testing of Resistive RAM Based Convolutional Neural Networks.
Anurup Saha
Kwondo Ma
Chandramouli N. Amarnath
Abhijit Chatterjee
Published in:
IOLTS (2024)
Keyphrases
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convolutional neural networks
lightweight
database
computationally efficient
real time
data mining
similarity measure
artificial neural networks
multiresolution
probabilistic model
computationally expensive
design considerations