Login / Signup

Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence.

Vineeth VeetilDennis SylvesterDavid T. BlaauwSaumil ShahSteffen Rochel
Published in: DAC (2009)
Keyphrases
  • high speed
  • real time
  • evolutionary algorithm
  • data analysis
  • state space
  • lightweight
  • cost effective
  • computationally expensive