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Robustness of Time-Resolved Measurement to Unknown and Variable Beam Current in Particle Beam Microscopy.
Luisa Watkins
Sheila W. Seidel
Minxu Peng
Akshay Agarwal
Christopher C. Yu
Vivek K. Goyal
Published in:
ICIP (2021)
Keyphrases
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cross section
image analysis
reinforced concrete
real time
database
databases
information retrieval
artificial intelligence
pattern recognition
microscopy images