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Determination of the optical constants of a semiconductor thin film employing the matrix method.

Raúl José Martín-PalmaJ. M. Martínez-DuartH. Angus Macleod
Published in: IEEE Trans. Educ. (2000)
Keyphrases
  • covariance matrix
  • similarity measure
  • objective function
  • pairwise
  • database
  • neural network
  • machine learning
  • knowledge discovery
  • decision makers
  • clustering method
  • thin film