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A new short-channel-effect-degraded subthreshold behavior model for elliptical gate-all-around MOSFET.
Te-Kuang Chiang
Ying-Wen Ko
Hong-Wun Gao
Yeong-Her Wang
Published in:
ASICON (2017)
Keyphrases
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probabilistic model
neural network
objective function
cost function
em algorithm
theoretical framework
mathematical model
conceptual model
formal model
multi agent
probability distribution
management system
statistical model
experimental data
multiple input