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Charge Trapping in GaN Power Transistors: Challenges and Perspectives.

Matteo MeneghiniNicola ModoloArianna NardoCarlo De SantiAndrea MinettoLuca SayadiChristian KollerSebastien SicreGerhard PrechtlGaudenzio MeneghessoEnrico Zanoni
Published in: BCICTS (2021)
Keyphrases
  • power consumption
  • high power
  • lessons learned
  • real world
  • key issues
  • space charge
  • data sets
  • parallel processing
  • open issues
  • database
  • case study
  • low power