Charge Trapping in GaN Power Transistors: Challenges and Perspectives.
Matteo MeneghiniNicola ModoloArianna NardoCarlo De SantiAndrea MinettoLuca SayadiChristian KollerSebastien SicreGerhard PrechtlGaudenzio MeneghessoEnrico ZanoniPublished in: BCICTS (2021)