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Accurate Substrate Noise Analysis Based on Library Module Characterization.

Subodh M. ReddyRajeev Murgai
Published in: VLSI Design (2006)
Keyphrases
  • quantitative analysis
  • statistical analysis
  • neural network
  • website
  • high quality
  • data analysis
  • high accuracy
  • noisy data
  • error analysis
  • real world
  • information systems
  • case study
  • denoising