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Edge Word-Line Reliability Problem in 3-D NAND Flash Memory: Observations, Analysis, and Solutions.
Debao Wei
Hua Feng
Ming Liu
Yu Song
Zhelong Piao
Cong Hu
Liyan Qiao
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2023)
Keyphrases
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flash memory
data analysis
database
file system
buffer management
garbage collection
real time
data sets
similarity measure
training data