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Edge Word-Line Reliability Problem in 3-D NAND Flash Memory: Observations, Analysis, and Solutions.

Debao WeiHua FengMing LiuYu SongZhelong PiaoCong HuLiyan Qiao
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2023)
Keyphrases
  • flash memory
  • data analysis
  • database
  • file system
  • buffer management
  • garbage collection
  • real time
  • data sets
  • similarity measure
  • training data