Towards Automated Detection of Higher-Order Memory Corruption Vulnerabilities in Embedded Devices.
Lei YuLinyu LiHaoyu WangXiaoyu WangHouhua HeXiaorui GongPublished in: DATE (2021)
Keyphrases
- automated detection
- embedded devices
- higher order
- limited memory
- data corruption
- automated analysis
- flash memory
- mobile devices
- embedded systems
- lung cancer
- memory space
- memory requirements
- information security
- main memory
- real time
- data storage
- sliding window
- data streams
- databases
- management system
- information systems
- influence diagrams
- security mechanisms
- open source
- data structure
- data mining