Enabling low-resolution ADC with high-order modulations for millimeter-wave systems.

Umut Ugurlu Risto Wichman

Published in: ICC (2016)

Keyphrases

high order
low resolution
high resolution
super resolution
low resolution images
higher order
millimeter wave
imaging process
high quality
pairwise
face images
high resolution images
depth map
computer vision
image analysis
multiscale
feature extraction
three dimensional