Applying Features of IEEE 754 to Sign/Logarithm Arithmetic.

Mark G. Arnold Thomas A. Bailey John R. Cowles Mark D. Winkel

Published in: IEEE Trans. Computers (1992)

Keyphrases

feature extraction
feature vectors
image features
feature set
salient features
low level
feature space
classification accuracy
extracting features
neural network
rich set
structural information
false positives
benchmark datasets
multiresolution
mobile devices
face recognition
high level