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An SRAM-Based PUF With a Capacitive Digital Preselection for a 1E-9 Key Error Probability.

Yizhak ShifmanAvi MillerOsnat KerenYoav WeizmanJoseph Shor
Published in: IEEE Trans. Circuits Syst. (2020)
Keyphrases
  • empirical risk
  • error probability
  • uniform convergence
  • power consumption
  • electronic devices
  • data sets
  • support vector