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Analyzing the Single Event Upset Vulnerability of Binarized Neural Networks on SRAM FPGAs.
Ioanna Souvatzoglou
Athanasios Papadimitriou
Aitzan Sari
Vasileios Vlagkoulis
Mihalis Psarakis
Published in:
CoRR (2024)
Keyphrases
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neural network
pattern recognition
event detection
genetic algorithm
recurrent neural networks
artificial neural networks
fuzzy logic
document images
rbf network
image processing
control system
input image
computer networks
data transmission
event recognition