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An Enhanced Tree-Structured Scan Chain for Pseudo-Exhaustive Testing of VLSI Circuits.

Jiann-Chyi RauKuo-Chun Kuo
Published in: IWSOC (2003)
Keyphrases
  • vlsi circuits
  • low power
  • tree structure
  • tree structured data
  • tree structures
  • real time
  • multimedia
  • decision trees
  • high speed
  • index structure
  • structured data
  • computer vision and image processing