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Efficient Mixed-Type Wafer Defect Pattern Recognition Using Compact Deformable Convolutional Transformers.

Nitish Shukla
Published in: CoRR (2023)
Keyphrases
  • machine learning
  • pairwise
  • data sets
  • feature selection
  • website
  • expert systems
  • computationally efficient
  • pattern matching
  • sparse coding
  • associative memory
  • massively parallel