A production-oriented measurement method for fast and exhaustive Iddq tests.
B. LaquaiH. RichterH. WerkmannPublished in: ED&TC (1997)
Keyphrases
- computational cost
- high precision
- fully automatic
- significant improvement
- high accuracy
- preprocessing
- experimental evaluation
- support vector machine svm
- synthetic data
- classification accuracy
- support vector machine
- input image
- mutual information
- input data
- clustering method
- classification method
- dynamic programming
- face recognition
- statistical methods