All-Digital VCO-ADC TAD Confirming Scaling and Stochastic Effects Using 16-nm FinFET CMOS.

Takamoto Watanabe

Published in: ICECS (2021)

Keyphrases

analog to digital converter
metal oxide semiconductor
circuit design
cmos image sensor
low cost
monte carlo
power consumption
cmos technology
mixed signal
low power
stochastic model
single chip
nm technology
high speed
dynamic range
analog vlsi