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Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model.

Lili DingWei ChenHongxia GuoTan WangRongmei ChenYinhong LuoFengqi ZhangXiaoyu Pan
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • theoretical framework
  • statistical model
  • high level
  • cost function
  • computational model
  • network structure
  • similarity measure
  • parameter estimation
  • mathematical model
  • hierarchical structure
  • metamodel
  • object model