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Assessing Distortion Within the IEC Framework in the Presence of High Frequency Components: Some Considerations on Signal Processing.

Adam J. CollinRoberto LangellaAlfredo TestaSasa Z. DjokicJiri Drapela
Published in: AMPS (2018)
Keyphrases
  • signal processing
  • fourier transform
  • high frequency components
  • high quality
  • pattern recognition