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Examination of hot carrier effects of the AlGaAs/InGaAs pHEMT through device simulation.

Jason B. SteighnerJiann-Shiun Yuan
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • simulation environment
  • data sets
  • machine learning
  • simulation model
  • collision detection
  • real world
  • multimedia
  • case study
  • multi agent
  • mobile terminals