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Gradient steepness metrics using extended Baum-Welch transformations for universal pattern recognition tasks.

Tara N. SainathDimitri KanevskyBhuvana Ramabhadran
Published in: ICASSP (2008)
Keyphrases
  • pattern recognition tasks
  • hidden markov models
  • baum welch
  • computer vision
  • computer vision and pattern recognition
  • multi dimensional
  • sequential data
  • discrete hidden markov models
  • graph theory