Multiple quantum well PIN optoelectronic devices and a method of restoring failed device characteristics.
K. IkossiWilliam S. RabinovichD. S. KatzerSteven C. BinariJ. MitterederPeter G. GoetzPublished in: Microelectron. Reliab. (2002)
Keyphrases
- detection method
- pairwise
- significant improvement
- high accuracy
- high precision
- preprocessing
- probabilistic model
- experimental evaluation
- support vector machine
- theoretical analysis
- detection algorithm
- clustering method
- electronic devices
- data sets
- classification method
- mobile devices
- objective function
- neural network