Prediction of Statistical Distribution on Nanosheet FET by Geometrical Variability Using Various Machine Learning Models.
Jonghyeon HaSun-Jin KimMinji BangGyeongyeop LeeMinki SuhMinseob ShimChong-Eun KimJungsik KimPublished in: IEEE Access (2023)
Keyphrases
- machine learning models
- statistical distribution
- predictive model
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- spam filtering
- prediction model
- machine learning algorithms
- prediction accuracy
- machine learning approaches
- probability density function
- machine learning
- decision trees
- image segmentation
- neural network
- learning models
- historical data
- training set
- artificial neural networks