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A Machine Learning Approach to Modeling Intrinsic Parameter Fluctuation of Gate-All-Around Si Nanosheet MOSFETs.
Rajat Butola
Yiming Li
Sekhar Reddy Kola
Published in:
IEEE Access (2022)
Keyphrases
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artificial intelligence
bayesian networks
input parameters
neural network
database
databases
information retrieval
website
image sequences
multiscale
long term
parameter estimation
parameter values