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Failure Analysis of Open Faults by Using Detecting/Un-detecting Information on Tests.
Yuichi Sato
Hiroshi Takahashi
Yoshinobu Higami
Yuzo Takamatsu
Published in:
Asian Test Symposium (2004)
Keyphrases
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data analysis
automatic detection
domain knowledge
information processing
databases
artificial intelligence
information retrieval systems
spatial information
machine learning
software engineering
statistical analysis
information flow
semantic analysis
intelligence analysis