MCTest: towards an improvement of match algorithms for models.
Vicente García-DíazB. Cristina Pelayo García-BusteloOscar Sanjuán MartínezEdward Rolando Núñez-ValdézJuan Manuel Cueva LovellePublished in: IET Softw. (2012)
Keyphrases
- free parameters
- recently developed
- significant improvement
- data sets
- computational efficiency
- learning algorithm
- data structure
- hidden markov models
- computationally expensive
- computationally efficient
- machine learning algorithms
- orders of magnitude
- statistical model
- theoretical models
- computational models
- process model
- optimization problems
- computational cost
- lower bound
- image segmentation
- computer vision
- machine learning