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Hamming Distance Computation in Unreliable Resistive Memory.

Zehui ChenClayton SchoenyLara Dolecek
Published in: IEEE Trans. Commun. (2018)
Keyphrases
  • hamming distance
  • binary strings
  • distance measure
  • pattern matching
  • binary codes
  • memory usage
  • binary representation
  • memory space
  • image processing
  • memory requirements
  • visual features
  • edit distance
  • hamming space