Study and Implementation of 600-V High-Voltage Gate Driver IC With the Common-Mode Dual-Interlock Technique for GaN Devices.
Jing ZhuSiyuan YuYangyang LuWeifeng SunChuanyi ChengDing YanYunwu ZhangShaohong LiLong ZhangSen ZhangNailong HeYan GuPublished in: IEEE Trans. Ind. Electron. (2021)