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MicroNet: Improving Image Recognition with Extremely Low FLOPs.
Yunsheng Li
Yinpeng Chen
Xiyang Dai
Dongdong Chen
Mengchen Liu
Lu Yuan
Zicheng Liu
Lei Zhang
Nuno Vasconcelos
Published in:
ICCV (2021)
Keyphrases
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image recognition
pattern recognition
image classification
face recognition
high levels
image retrieval
low cost
proceedings of the th international conference
image processing
highly correlated
multi instance learning