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Nanometer control of the markerless overlay process using thermal scanning probe lithography.

Colin RawlingsUrs DürigJames L. HedrickDan CoadyArmin Knoll
Published in: AIM (2014)
Keyphrases
  • markerless
  • motion tracking
  • image processing
  • viewpoint
  • software engineering
  • structure from motion
  • human motion capture