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Count Your Toggles: a New Leakage Model for Pre-Silicon Power Analysis of Crypto Designs.

Rajat SadhukhanPaulson MathewDebapriya Basu RoyDebdeep Mukhopadhyay
Published in: J. Electron. Test. (2019)
Keyphrases
  • computational model
  • probability distribution
  • probabilistic model
  • databases
  • similarity measure
  • input data