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The Effect of Deep N+ Well on Single-Event Transient in 65 nm Triple-Well NMOSFET.
Jizuo Zhang
Jianjun Chen
Pengcheng Huang
Shouping Li
Liang Fang
Published in:
Symmetry (2019)
Keyphrases
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database
event detection
information retrieval
genetic algorithm
decision trees
image sequences
similarity measure
artificial neural networks
evolutionary algorithm
high speed