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The Effect of Deep N+ Well on Single-Event Transient in 65 nm Triple-Well NMOSFET.

Jizuo ZhangJianjun ChenPengcheng HuangShouping LiLiang Fang
Published in: Symmetry (2019)
Keyphrases
  • database
  • event detection
  • information retrieval
  • genetic algorithm
  • decision trees
  • image sequences
  • similarity measure
  • artificial neural networks
  • evolutionary algorithm
  • high speed