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Towards automatic redeye effect removal.
Bogdan Smolka
K. Czubin
Jon Yngve Hardeberg
Kostas N. Plataniotis
Marek Szczepanski
Konrad W. Wojciechowski
Published in:
Pattern Recognit. Lett. (2003)
Keyphrases
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databases
negative impact
database
information retrieval
learning algorithm
image sequences
feature extraction
computational complexity
lower bound
viewpoint
image analysis
management system