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Implement Improved Process Design Using a Lightweight Deep Learning Model to Reduce Hardware Computational Load in Instance Segmentation: Using Apple Dataset.
Donggyu Choi
Jongwook Jang
Published in:
IEEE Access (2022)
Keyphrases
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lightweight
computational load
deep learning
probabilistic model
metamodel
training data
image processing
image segmentation
pattern recognition
active learning
supervised learning
level set