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Implement Improved Process Design Using a Lightweight Deep Learning Model to Reduce Hardware Computational Load in Instance Segmentation: Using Apple Dataset.

Donggyu ChoiJongwook Jang
Published in: IEEE Access (2022)
Keyphrases
  • lightweight
  • computational load
  • deep learning
  • probabilistic model
  • metamodel
  • training data
  • image processing
  • image segmentation
  • pattern recognition
  • active learning
  • supervised learning
  • level set