Login / Signup

A polarimetric extension of the van Cittert-Zernike Theorem for use with microwave Interferometers.

Jeffrey R. PiepmeierN. K. Simon
Published in: IEEE Geosci. Remote. Sens. Lett. (2004)
Keyphrases
  • multispectral
  • zernike moments
  • multiscale
  • von neumann
  • automatic target recognition
  • sar imagery
  • feature selection