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On a New Class of Bounds on Bayes Risk in Multihypothesis Pattern Recognition.

Pierre A. Devijver
Published in: IEEE Trans. Computers (1974)
Keyphrases
  • bayes risk
  • pattern recognition
  • upper and lower bounds
  • reproducing kernel hilbert space
  • lower bound
  • upper bound
  • loss function
  • regularization parameter
  • distortion measure
  • feature extraction
  • class labels