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Hybrid HCI Degradation in Sub-micron NMOSFET due to Mixed Back-end Process Damages.

Kuilong YuXiaojuan ZhuRui FangTingting MaKun HanZhongyi Xia
Published in: IRPS (2020)
Keyphrases
  • back end
  • data types
  • data management
  • development process
  • real time
  • neural network
  • search engine
  • building blocks
  • human computer interaction
  • process model