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MOD-YOLO: Rethinking the YOLO architecture at the level of feature information and applying it to crack detection.
Peng Su
Huizi Han
Mei Liu
Tao Yang
Shijie Liu
Published in:
Expert Syst. Appl. (2024)
Keyphrases
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information sources
databases
higher level
neural network
prior knowledge
domain knowledge
image features
information content
feature values
face recognition
image retrieval
information extraction
information processing
information overload