A Memory-efficient Bounding Algorithm for the Two-terminal Reliability Problem.
Minh LêMax WalterJosef WeidendorferPublished in: Electron. Notes Theor. Comput. Sci. (2013)
Keyphrases
- memory efficient
- learning algorithm
- segmentation algorithm
- k means
- detection algorithm
- computational complexity
- computational cost
- experimental evaluation
- improved algorithm
- input data
- iterative deepening
- cost function
- optimal solution
- optimization algorithm
- computationally efficient
- external memory
- recognition algorithm
- integral image
- high accuracy
- probabilistic model
- dynamic programming
- np hard
- significant improvement
- preprocessing
- pattern growth
- linear programming
- memory requirements
- ant colony optimization
- expectation maximization
- simulated annealing
- worst case
- feature selection