MOSFET model assessment for submicron and nanometer bulk-driven applications.

Shaoxi Wang Rui He Lihong Zhang

Published in: CCECE (2009)

Keyphrases

probabilistic model
mathematical model
computational model
database
high level
parameter estimation
experimental data
conceptual model
parameter values
neural network
three dimensional
artificial neural networks
statistical model
sensitivity analysis
bayesian framework
formal model