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A MOS Parametric Integrator With Improved Linearity for SC ΣΔ Modulators.

B. Hoda SeyedhosseinzadehA. Nabavi
Published in: IEEE Trans. Circuits Syst. II Express Briefs (2015)
Keyphrases
  • improved algorithm
  • databases
  • image processing
  • real world
  • data mining
  • computer vision
  • higher order