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Study of single event transient induced by heavy-ion in NMOS transistor and CMOS inverter.
Cheng Gao
Rui Zhang
Jiaoying Huang
Chengcheng Fu
Published in:
Concurr. Comput. Pract. Exp. (2019)
Keyphrases
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control algorithm
experimental study
steady state
low power
information systems
low cost
empirical studies
vlsi circuits