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A Wide-Range On-Chip Leakage Sensor Using a Current-Frequency Converting Technique in 65-nm Technology Node.
Yesung Kang
Jaehyouk Choi
Youngmin Kim
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2015)
Keyphrases
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wide range
nm technology
power consumption
low power
high speed
sensor data
real time
tree structure
graph structure
neural network
low cost
multi sensor
vlsi implementation