A combinatorial group testing method for FPGA fault location.
Carthik A. SharmaRonald F. DeMaraPublished in: ACST (2006)
Keyphrases
- experimental evaluation
- support vector machine svm
- synthetic data
- objective function
- computational cost
- detection method
- pairwise
- high order
- high precision
- high accuracy
- real time image processing
- similarity measure
- classification method
- clustering method
- high speed
- dynamic programming
- significant improvement
- preprocessing