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Improved 3LIN Hardness via Linear Label Cover.
Prahladh Harsha
Subhash Khot
Euiwoong Lee
Devanathan Thiruvenkatachari
Published in:
Electron. Colloquium Comput. Complex. (2019)
Keyphrases
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improved algorithm
special case
learning theory
closed form
multi label
np complete
linear systems
database
information theoretic
image classification
multiscale
website
computer vision
search engine
machine learning
neural network
databases
real time