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Numerical Examination of Photon Recycling as an Explanation of Observed Carrier Lifetime in Direct Bandgap Materials.
Joseph W. Parks Jr.
Kevin F. Brennan
Arlynn W. Smith
Published in:
VLSI Design (1998)
Keyphrases
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numerical analysis
information systems
numerical data
learning materials
metadata
multi agent
sensitivity analysis
explanation based learning
abductive reasoning
mechanical properties
partially observed
materials science
causal explanation