MCMC-Based Algorithm to Adjust Scale Bias in Large Series of Electron Microscopical Ultrathin Sections.
Huaizhong ZhangE. Patricia RodriguezPhilip J. MorrowSally I. McCleanKurt SaetzlerPublished in: CAIP (2009)
Keyphrases
- dynamic programming
- experimental evaluation
- learning algorithm
- detection algorithm
- worst case
- k means
- mathematical analysis
- np hard
- optimal solution
- monte carlo
- neural network
- simulated annealing
- sampling algorithm
- markov chain monte carlo
- times faster
- matching algorithm
- objective function
- computational cost
- computational complexity
- significant improvement
- parameter estimation
- high accuracy
- kalman filter
- probabilistic model