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An Efficient and Reliable Approach for Semiconductor Device Parameter Extraction.
Shui-Jinn Wang
Jau-Yien Lee
Chun-Yen Chang
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1986)
Keyphrases
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semiconductor devices
parameter settings
automatically extracted
databases
information extraction
steady state
knowledge extraction
automatic extraction
optimal parameters
field effect transistors
e learning
cost effective
single parameter