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JITO: a tool for just-in-time defect identification and localization.

Fangcheng QiuMeng YanXin XiaXinyu WangYuanrui FanAhmed E. HassanDavid Lo
Published in: ESEC/SIGSOFT FSE (2020)
Keyphrases
  • analysis tool
  • special case
  • automatic identification
  • data sets
  • high level
  • database systems
  • mass spectrometry
  • identification rate
  • source localization